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Used for the characterization of highly radioactive irradiated nuclear materials, transuranic-bearing specimens, as well as for the investigation of radiochemical processes, the RPL Helios 660 dual-beam focused ion beam/scanning electron microscope, or FIB/SEM, enables us to identify microstructures and phases and the composition of radioactive nuclear materials. Housed in RPL, the SEM-FIB with its corrected-probe, capable of 0.6 nm imaging resolution, enables 3-D imaging, ‘slice and view’ analysis, compositional analysis with Energy Dispersive X-ray Spectroscopy, and phase/grain orientation analysis with Electron Backscattered Diffraction of highly radioactive samples with high spatial resolution.

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Document Title: SEM-FIB Room in the RPL
Category: Nuclear Research and Facilities, Security: Local-National-International
Media Type: Photos
Date of Image/Photo: July 15, 2015
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URL of this page: http://picturethis.pnl.gov/picturet.nsf/by+id/DRAE-,59TDT

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