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This multitechnique surface analysis system can determine the composition and chemical nature of surfaces using x-ray photo-electron spectroscopy (XPS), Auger electron spectroscopy (AES), ion-scattering spectrometry (ISS), or secondary ion mass spectrometry (SIMS). The system is compatible with the William R. Wiley Environmental Molecular Sciences Laboratory vacuum sample transfer system that facilitates the exchange of samples among other analytical or synthesis chambers and five portable experimental carts, including the deposition cart shown in the photograph.

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Document Title: Surface Analysis System
Category: EMSL (William R. Wiley Environmental Molecular Sciences Laboratory)
Media Type: Photos
Date of Image/Photo: 11/21/97
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