Skip to Main Content U.S. Department of Energy
PictureThis

This multitechnique surface analysis system can determine the composition and chemical nature of surfaces using x-ray photo-electron spectroscopy (XPS), Auger electron spectroscopy (AES), ion-scattering spectrometry (ISS), or secondary ion mass spectrometry (SIMS). The system is compatible with the William R. Wiley Environmental Molecular Sciences Laboratory vacuum sample transfer system that facilitates the exchange of samples among other analytical or synthesis chambers and five portable experimental carts, including the deposition cart shown in the photograph.

Click here to download a TIFF image for pasting into presentations
PC Users: click on the link above with your right mouse button and select "save link as" or "save target as" to download image.
Mac Users: position your cursor on the link above, hold down the option key and click then select "save link as" or "save target as".

(Brochure quality TIFF image unavailable due to low resolution of the original image.)
Document Title: Surface Analysis System
Category: EMSL (William R. Wiley Environmental Molecular Sciences Laboratory)
Media Type: Photos
Date of Image/Photo: 11/21/97
Background:
URL of this page: http://picturethis.pnl.gov/picturet.nsf/by+id/SMAA-477QJL

PICTURETHIS

BROWSE IMAGES BY

Other