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The Time of Flight Secondary Ion Mass Spectrometer (TOF SIMS) at the Environmental Molecular Sciences Laboratory (EMSL) is an ultrahigh vacuum surface analytical system. Using this resource, scientists examine surface structure, composition, and chemical state by means of secondary ion detection during ion sputtering.

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Document Title: Mass Spectrometer, TOF-SIMS
Category: EMSL (William R. Wiley Environmental Molecular Sciences Laboratory)
Media Type: Photos
Date of Image/Photo: June 2009
Background: For more information on the capabilities in EMSL, see http://www.emsl.pnl.gov
URL of this page: http://picturethis.pnl.gov/picturet.nsf/by+id/DRAE-7VPNHB

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