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The Environmental Scanning Electron Microscope is a new-generation SEM with the ability to image samples under controlled environments and temperatures. The ESEM offers precise 3D section analysis morphology, focused ion beam, electron backscattering diffraction, and energy dispersive x-ray analysis. It is an essential tool for many ceramics, electronics, geochemistry, geology, catalysis, and materials science investigators. EMSL is a Department of Energy national scientific user facility located at PNNL.

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Document Title: Environmental Scanning Electron Microscope (ESEM)
Category: EMSL (William R. Wiley Environmental Molecular Sciences Laboratory)
Media Type: Photos
Date of Image/Photo: March 2011
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URL of this page: http://picturethis.pnl.gov/picturet.nsf/by+id/DRAE-8JW2NY

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